Park NX-HDM

    Identifying nanoscale defects is a very time consuming process for engineers working with media and flat substrates.
    Park NX-HDM is an atomic force microscopy system that speeds up the defect review process by an order of magnitude through automated defect identification, scanning, and analysis. It links directly with a wide range of optical inspection tools, thus significantly increasing the automatic defect review throughput. With its industry's lowest noise floor, and its unique True Non-Contact™ technology, the Park NX-HDM is the most accurate AFM for surface roughness measurement on the market.


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    TEL: +886-3-3566-747

    FAX: +886-3-3566-848

    LOCATION : 11F., No. 906, Jingguo Rd., Luzhu Dist., Taoyuan City 338018, Taiwan (R.O.C.)