Park NX10 provides nanoscale electrical property characteriziation AFM for electrical property and electronics research that includes an optimized signal-to-noise ratio for ultra-low electrical signal detection. Using Park NX10, researchers can investigate and characterize various electrical properties with high sensitivity and productivity and without worry from frequent disturbances from electrical noise.
Park NX10 produces data you can trust, replicate, and publish at the highest nano resolution. From sample setting to full scan imaging, measurement, and analysis, Park NX10 saves you time every step of the way. With more time and better data, you can focus on doing more innovative research.