Park NX-Hivac

Park NX-Hivac allows researchers to enhance electrical property measurement sensitivity through high vacuum environment control. This allows researchers to characterize electrical properties more accurately with higher spatial resolution and improved signal-to-noise ratio than when scanning under ambient conditions. Equipped with both automatic high vacuum control with dedicated management software and a chamber-optimized Park NX-AFM design, the Park NX-Hivac is built to enable researchers to easily acquire crucial data from samples under otherwise difficult vacuum conditions.